Built in Self Test Architecture Using Logic Module
نویسندگان
چکیده
منابع مشابه
Built-in Self-test Architecture Using Logic Module
A Built-in self-test technique constitute a class of algorithms that provide the capability of performing at speed testing with high fault coverage, whereas at the same time they relax the reliance on expensive external testing equipment. Hence, they constitute a striking solution to the problem of testing VLSI devices. BIST techniques are typically classified into offline and online Concurrent...
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ژورنال
عنوان ژورنال: International Journal of VLSI Design & Communication Systems
سال: 2017
ISSN: 0976-1527,0976-1357
DOI: 10.5121/vlsic.2017.8403